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(Correlation between residual strain and dislocation density in silicon cast growth determined by SIRP and XRT)
Beam Injection Assessment in Semiconductor Materials 12. 2014.
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:16:59 +0900Updated at: 2017-07-10 21:56:51 +0900