HOME > Presentation > Detail
International Standardization of Nanoscale Characterization using Scanning Probe Microscopy through VAMAS
First Indian Materials Conclave and 30th Annual General Meeting of MRSI. February 12, 2019-February 15, 2019. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2019-11-20 09:52:01 +0900Updated at: 2024-03-05 12:21:14 +0900