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Observation of Stress-induced Domain Redistribution on Si(100) Surfaces using Stress-Field Scanning Tunneling Microscopy
The tenth ISSP International Symposium on Nanoscience at Surface. October 09, 2006-October 13, 2006.
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Created at: 2017-02-14 11:09:53 +0900Updated at: 2017-07-10 19:44:44 +0900