HOME > 口頭発表 > 書誌詳細Observation of Stress-induced Domain Redistribution on Si(100) Surfaces using Stress-Field Scanning Tunneling MicroscopyFUJITA, Daisuke, KITAHARA, Masayo, SAGISAKA, Keisuke. The tenth ISSP International Symposium on Nanoscience at Surface. 2006.NIMS著者藤田 大介鷺坂 恵介Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-14 11:09:53 +0900更新時刻: 2017-07-10 19:44:44 +0900