Lattice-plane orientation mapping of GaN using synchrotron x-ray diffraction topography
The Asia-Pacific Conference on Silicon Carbide and Related Materials (APCSCRM 2019). 2019. 招待講演
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作成時刻: 2019-07-27 03:00:20 +0900更新時刻: 2024-03-05 12:21:06 +0900