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SiおよびGeナノワイヤへの不純物ドーピングと評価
(Doping and characterization of impurity atoms in Si and Ge nanowires)
第31回電子材料シンポジウム. July 11, 2012-July 13, 2012. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 05:30:10 +0900 Updated at: 2024-03-05 11:44:02 +0900