HOME > Presentation > Detail
X-ray optical sectioning microscopy: towards visulization of buried function layers and interfaces in thin films (I)
第65回応用物理学会 春季学術講演会. March 17, 2018-March 20, 2018.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2018-02-02 22:31:36 +0900 Updated at: 2018-06-05 14:17:53 +0900
