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Si基板上に直接成長させたGeのRBS測定
(RBS measurement of Ge directly grown on Si substrate)
2011年秋期第72回応用物理学会学術講演会. August 29, 2011-September 02, 2011.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:43:27 +0900 Updated at: 2017-07-10 21:09:16 +0900