HOME > 口頭発表 > 書誌詳細Influence of carrier injection on the Si(100) surface structure studied by low temperature scanning tunneling microscopySAGISAKA, Keisuke, FUJITA, Daisuke. European Conference on Surface Science 23. 2005.NIMS著者鷺坂 恵介藤田 大介Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-25 01:00:25 +0900更新時刻: 2017-07-10 19:24:24 +0900