HOME > 口頭発表 > 書誌詳細Electron Beam Induced Current Investigation of Stress-Induced Leakage and Breakdown Processes in High-k stacksCHEN, Jun. 2009 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM. 2009.NIMS著者陳 君Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 12:23:53 +0900更新時刻: 2022-09-05 12:23:53 +0900