HOME > Presentation > Detailスクリプト制御FIB-SEM装置による自動3次元アトムプローブ試料作製技術の確立(Automated tip preparation for 3D atom probe by script-controllable FIB-SEM system)埋橋 淳, 大久保 忠勝, 宝野 和博. 日本顕微鏡学会第79回学術講演会. June 26, 2023-June 28, 2023.NIMS author(s)UZUHASHI, JunOHKUBO, TadakatsuHONO, KazuhiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2023-09-14 03:21:26 +0900 Updated at: 2023-09-14 03:21:26 +0900