HOME > Presentation > Detail
Fine Structure Analysis of High Temperature Heat Treated SUSXM15J1 Using FIB-SEM Tomography.
日本顕微鏡学会 第60回記念シンポジウム. December 01, 2017-December 02, 2017.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-12-02 22:20:42 +0900Updated at: 2018-06-05 14:15:51 +0900