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Si基板上に直接成長させたGeのDLTS測定(II)
(DLTS measurement of Ge directly grown on Si substrate(II))
2012年秋期第73回応用物理学術講演会. September 11, 2012-September 14, 2012.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:23:21 +0900 Updated at: 2017-07-10 21:27:34 +0900