HOME > Presentation > Detail
Photoelectron Spectroscopic Study on High-k Dielectrics Based Nanoionics-Type ReRAM Structure under Bias Operation
the 225th ECS Meeting. May 11, 2014-May 16, 2014. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2022-09-05 14:12:34 +0900 Updated at: 2024-03-05 11:44:59 +0900