HOME > Presentation > DetailGaN:Eu赤色LED中の欠陥からの多重エネルギー伝搬によるEuの再発光(Repeated emission of Eu by multi-path energy transfer from defects in GaN:Eu red LED)石井 真史, 稲葉智宏, 藤原康文. International conference on defects in semiconductors. July 31, 2017-August 04, 2017.NIMS author(s)ISHII, MasashiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-08-02 22:30:41 +0900 Updated at: 2018-06-05 14:11:25 +0900