Novel electron microscopy method for accurate measurements of the lattice constant changes in layered structures
| 著者 | BEKAREVICH, Raman, MITSUISHI, Kazutaka, OHNISHI, Tsuyoshi, UESUGI, Fumihiko, TAKEGUCHI, Masaki. |
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| 会議名 | 8th International Symposium on Practical Surface Analysis |
| 発表年 | 2019 |
| 言語 | English |