HOME > 口頭発表 > 書誌詳細Novel electron microscopy method for accurate measurements of the lattice constant changes in layered structuresBEKAREVICH, Raman, MITSUISHI, Kazutaka, OHNISHI, Tsuyoshi, UESUGI, Fumihiko, TAKEGUCHI, Masaki. 8th International Symposium on Practical Surface Analysis. 2019.NIMS著者三石 和貴大西 剛上杉 文彦竹口 雅樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2019-11-22 03:00:19 +0900更新時刻: 2019-11-22 03:00:19 +0900