HOME > Presentation > DetailSiおよびGeナノワイヤ中への不純物ドーピングと評価(Doping and characterization of impurity atoms in Si and Ge nanowires)深田 直樹. E-MRS. May 27, 2013-May 31, 2013. InvitedNIMS author(s)FUKATA, NaokiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:39:20 +0900 Updated at: 2024-03-05 11:44:33 +0900