HOME > Presentation > Detail
SiおよびGeナノワイヤ中への不純物ドーピングと評価
(Doping and characterization of impurity atoms in Si and Ge nanowires)
Advancement of Group IV Nanostructures Nanophotonics and Nanoele. November 18, 2014-November 19, 2014. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 03:42:57 +0900Updated at: 2024-03-05 11:45:21 +0900