HOME > 口頭発表 > 書誌詳細Probing surface band bending of polar GaN by hard X-ray photoemission combined with X-ray total reflection上田 茂典. AVS 65th International Symposium. 2018.NIMS著者上田 茂典Materials Data Repository (MDR)上の本文・データセット作成時刻: 2018-06-05 14:20:28 +0900更新時刻: 2018-06-05 14:20:28 +0900