HOME > Presentation > DetailProbing surface band bending of polar GaN by hard X-ray photoemission combined with X-ray total reflection上田 茂典. AVS 65th International Symposium. October 21, 2018-October 26, 2018.NIMS author(s)UEDA, ShigenoriFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-06-05 14:20:28 +0900Updated at: 2018-06-05 14:20:28 +0900