HOME > Presentation > DetailNEW-MODEL ULTRA-SOFT X-RAY SPECTROMETER FOR ELECTRON PROBE MICROANALYSIS 福島 整, 木村 隆, 塚本一徳, 田澤豊彦, 田沼 繁夫. 10th European Workshop of European Microbeam Analysis Society. 2007.NIMS author(s)KIMURA, TakashiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:43:37 +0900Updated at: 2017-07-10 19:47:40 +0900