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放射光軟X線分光によるグリーンデバイスのナノ表界面電子状態評価に関する研究
(Spectroscopic study of nano-scale surface/interface electronic states in Green devices using synchrotron soft X-rays)

2020年日本表面真空学会学術講演会. November 19, 2020-November 21, 2020. Invited

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2022-01-12 03:00:39 +0900Updated at: 2024-03-05 12:21:52 +0900

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