HOME > Presentation > Detail(Application of Multiple-Scanning-Probe Force Microscope to Nanoscale Electrical Measurement)久保 理, 新ヶ谷 義隆, 樋口 誠司, 倉持 宏実, 青野 正和, 中山 知信. MANA International Symposium 2010. March 03, 2010-March 05, 2010.NIMS author(s)SHINGAYA, YoshitakaAONO, MasakazuNAKAYAMA, TomonobuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 10:56:36 +0900Updated at: 2017-07-10 20:45:23 +0900