HOME > 口頭発表 > 書誌詳細Characterization of β-Ga2O3 and mosaic Diamond wafers by using EBSD and FIB/STEM technicsKoji TANAKA, Shinya OHMAGARI, Hitoshi UMEZAWA, Hideyuki WATANABE, Minoru TACHIKI, Miwako TAKANO, Hideaki YAMADA, Akiyoshi CHAYAHARA. 12th Asia-Pacific Microscopy Conference (APMC-2020). 2020.NIMS著者立木 実Materials Data Repository (MDR)上の本文・データセット作成時刻 :2021-05-03 03:00:17 +0900 更新時刻 :2021-05-03 03:00:17 +0900