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Characterization of β-Ga2O3 and mosaic Diamond wafers by using EBSD and FIB/STEM technics

著者Koji TANAKA, Shinya OHMAGARI, Hitoshi UMEZAWA, Hideyuki WATANABE, TACHIKI, Minoru, Miwako TAKANO, Hideaki YAMADA, Akiyoshi CHAYAHARA.
会議名12th Asia-Pacific Microscopy Conference (APMC-2020)
発表年2020
言語English

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