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Characterization of β-Ga2O3 and mosaic Diamond wafers by using EBSD and FIB/STEM technics

Koji TANAKA, Shinya OHMAGARI, Hitoshi UMEZAWA, Hideyuki WATANABE, Minoru TACHIKI, Miwako TAKANO, Hideaki YAMADA, Akiyoshi CHAYAHARA.
12th Asia-Pacific Microscopy Conference (APMC-2020). 2020.

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    作成時刻 :2021-05-03 03:00:17 +0900 更新時刻 :2021-05-03 03:00:17 +0900

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