Influence of lucky defects distributions on Early TDDB Failures in SiC Power MOSFETs

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Jaafar Chbili, Zakariae Chbili, 松田朝彦, Kin P. Cheung, Jason T. Ryan, Jason P. Campbell, Mhamed Lahbabi.

2017 IEEE International Integrated Reliability Workshop. 2017.

作成時刻: 2018-06-23 16:31:16 +0900更新時刻: 2018-06-23 16:31:16 +0900