Influence of lucky defects distributions on Early TDDB Failures in SiC Power MOSFETs

Jaafar Chbili, Zakariae Chbili, 松田朝彦, Kin P. Cheung, Jason T. Ryan, Jason P. Campbell, Mhamed Lahbabi.

2017 IEEE International Integrated Reliability Workshop. October 08, 2017-October 12, 2017.

Created at: 2018-06-23 16:31:16 +0900Updated at: 2018-06-23 16:31:16 +0900