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In situ nanobeam X-ray diffraction of vertical power devices grown on OVPE-GaN substrates
12th International Workshop on Nitride Semiconductors (IWN 2024). November 03, 2024-November 08, 2024.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2025-02-23 03:12:00 +0900 Updated at: 2025-02-23 03:12:00 +0900