HOME > Presentation > DetailAccurate Determination of Lattice Constant Deviation at Nanoscale by Diffraction Mappingベカレビッチ ラマン, 三石 和貴, 大西 剛, 間野 高明, 上杉 文彦, 竹口 雅樹. 19th International Microscopy Congress. 2018.NIMS author(s)MITSUISHI, KazutakaOHNISHI, TsuyoshiMANO, TakaakiUESUGI, FumihikoTAKEGUCHI, MasakiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-08-25 16:18:26 +0900Updated at: 2018-08-25 16:18:26 +0900