HOME > Presentation > DetailAccurate Determination of Lattice Constant Deviation at Nanoscale by Diffraction Mappingベカレビッチ ラマン, 三石 和貴, 大西 剛, 間野 高明, 上杉 文彦, 竹口 雅樹. 19th International Microscopy Congress. September 09, 2018-September 14, 2018.NIMS author(s)MITSUISHI, KazutakaMANO, TakaakiTAKEGUCHI, MasakiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-08-25 16:18:26 +0900 Updated at: 2018-08-25 16:18:26 +0900