HOME > Presentation > Detail
VLS法により成長したSiナノワイヤの構造評価
(Structural Characterization of Si Nanowires Grown by Vapor-Liquid-Solid Method)
The 66th Spring Meeting 2019. 2019.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2020-01-07 03:00:29 +0900Updated at: 2020-01-07 03:00:29 +0900