HOME > Presentation > Detail
(A Round Robin Study of Quantitative Evaluation of Electron Beam Damage on SiO2 Specimen in AES analysis)
3rd International Symposium on Practical Surface Analysis, PSA-0. October 04, 2004-October 06, 2004.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-25 00:43:41 +0900Updated at: 2017-07-10 19:05:19 +0900