HOME > Presentation > Detail
Operando Raman imaging analysis of atomic layer devices with micro-four-point probes
15th International Symposium on Atomic Level Characterizations for New Materials and Devices '24 (ALC'24). November 17, 2024-November 22, 2024.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2024-11-30 03:17:44 +0900Updated at: 2024-11-30 03:17:44 +0900