Reliability analysis of electronic device by using synchrotron X-ray nano-CT : Microstructural evolution of electrodes of MLCC
The 12th International Conference on the Science and Technology for Advanced Ceramics (STAC-12). 2021年07月06日-2021年07月08日.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2022-01-05 03:27:03 +0900 更新時刻: 2022-01-05 03:27:03 +0900