HOME > 口頭発表 > 書誌詳細Reliability analysis of electronic device by using synchrotron X-ray nano-CT : Microstructural evolution of electrodes of MLCC大熊 学, 齋藤 直哉, 水野 高太郎, 若井 史博. The 12th International Conference on the Science and Technology for Advanced Ceramics (STAC-12). 2021.NIMS著者大熊 学Materials Data Repository (MDR)上の本文・データセット作成時刻 :2022-01-05 03:27:03 +0900 更新時刻 :2022-01-05 03:27:03 +0900