(Experimental verification of the surface termination in the topological insulator TlBiSe2 with scanning tunneling microscopy and photoelectron spectroscopy)
K. Kuroda, M. Ye, E. F. Schwier, K. Shirai, M. Nakatake, 上田 茂典, K. Miyamoto, T. Okuda, H. Namatame, M. Taniguchi, Y. Ueda, A. Kimura.
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