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(Experimental verification of the surface termination in the topological insulator TlBiSe2 with scanning tunneling microscopy and photoelectron spectroscopy)

K. Kuroda, M. Ye, E. F. Schwier, K. Shirai, M. Nakatake, 上田 茂典, K. Miyamoto, T. Okuda, H. Namatame, M. Taniguchi, Y. Ueda, A. Kimura.
New Trends in Topological Insulators (NTTI) 2014. July 07, 2014-July 10, 2014.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-02-26 20:51:30 +0900Updated at: 2017-07-10 21:52:56 +0900

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