HOME > Presentation > Detailベイズ推定とXPSシミュレータSESSAによる試料構造の自動探索手法の開発(Development of Automatic Sample Structure Determination Technique using Bayesian Estimation and XPS Simulator SESSA)篠塚 寛志, 永田 賢二, 吉川 英樹, 庄野逸, 岡田真人. NIMS先端計測シンポジウム2023. 2023-02-24.NIMS author(s)SHINOTSUKA, HiroshiNAGATA, KenjiYOSHIKAWA, HidekiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2023-08-02 03:28:50 +0900Updated at: 2023-08-02 03:28:50 +0900