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非c軸配向Bi系超伝導体の走査SQUID顕微鏡による評価
(Characterization of non c-axis Oriented Bi-based Superconducting Thin Films by Scanning SQUID Microscopy)
日本MRS年次大会. December 05, 2017-December 07, 2017.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-09-12 22:23:08 +0900 Updated at: 2018-06-05 14:12:48 +0900