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走査電子顕微鏡による絶縁体基板上グラフェンの評価
(Analysis of graphene on insulator using scanning electron microscope)
第19回日本MRS学術シンポジウム. December 07, 2009-December 09, 2009.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:29:12 +0900 Updated at: 2017-07-10 20:38:36 +0900