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Study of the dependence of GaN surface oxidation on the crystalline plane by in-situ XPS during O2 molecular beam irradiation

ASAI, Yuya, 吉越章隆, 隅田真人, 上殿 明良, SUMIYA, Masatomo.
International workshop on nitride semiconductors 2018. 2018.

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    Created at: 2019-03-04 10:08:47 +0900Updated at: 2019-03-04 10:08:47 +0900

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