HOME > Presentation > Detail
TEM sample preparation using new nano-fabrication technique combining electron-beam-induced deposition and low energy ion millin
10th Conference on Frontiers of Electron Microscopy in Materials. September 25, 2005-September 30, 2005.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2022-09-05 11:44:08 +0900 Updated at: 2022-09-05 11:44:08 +0900