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アトムプローブ法によるGe/Siコアシェルナノワイヤ中の不純物分布
(Dopant Distribution in Ge / Si Core-Shell Nanowires Investigated by Atom Probe Tomography)
2015 MRS Fall Meeting. 2015.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 03:58:14 +0900Updated at: 2017-07-10 22:20:07 +0900