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(Observation of defects in polymeric optical waveguide using polarized guide-collection-mode near-field scanning optical microsco)
SPIE International Symposium OPTO2006 Integrated Optoelectric De. January 21, 2006-January 26, 2006.
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Created at: 2022-09-05 11:42:55 +0900 Updated at: 2022-09-05 11:42:55 +0900