SAMURAI - NIMS Researchers Database

HOME > 口頭発表 > 詳細

Evaluation of Structural Disorder and In-Gap States of III-V nitrides by Photothermal Deflection Spectroscopy

著者角谷 正友.
会議名7th International symposium of nitride semiconductors
発表年2018
言語Japanese

▲ページトップへ移動