HOME > Misc > DetailAnnealing of tungsten supertip fabricated on AFM probe by electron-beam-induced depositionLIU, ZHIQUAN, MITSUISHI, Kazutaka, FURUYA, Kazuo. Proceedings of the 16th International Microscopy Congress 980-980. 2006.NIMS author(s)MITSUISHI, KazutakaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-09-05 11:55:21 +0900 Updated at: 2022-09-05 11:55:21 +0900