X-ray Photoelectron Spectroscopy Study of Sulfur-terminated GaAs(001)-(2x6) Surface
(S終端処理GaAs(001)-(2x6)表面のX線光電子分光測定)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2022-09-05 10:52:26 +0900 Updated at: 2022-09-05 10:52:26 +0900
