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NIMS Award Symposium 2026

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X-ray Photoelectron Spectroscopy Study of Sulfur-terminated GaAs(001)-(2x6) Surface
(S終端処理GaAs(001)-(2x6)表面のX線光電子分光測定)

SHIMODA, Masahiko, 渡辺義夫, 塚本史郎, 杉山宗弘, 前山智, OHNO, Takahisa, 小口信行.

NIMS author(s)


    Fulltext and dataset(s) on Materials Data Repository (MDR)


      Created at: 2022-09-05 10:52:26 +0900 Updated at: 2022-09-05 10:52:26 +0900

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