HOME > Misc > DetailCharacterization of xenon nanoprecipitates embedded in aluminium crystals by means of 3-D TEM HASEGAWA, Akira, Hajime Matsumoto, Masayuki Shimojo, TAKEGUCHI, Masaki, MITSUISHI, Kazutaka, FURUYA, Kazuo. Proceedings of The 9th asia-pacific Microscopy Conference (APMC9) 229-230. 2008.NIMS author(s)HASEGAWA, AkiraTAKEGUCHI, MasakiMITSUISHI, KazutakaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-09-05 12:09:35 +0900Updated at: 2022-09-05 12:09:35 +0900
