HOME > その他の文献 > 書誌詳細Analysis of X-ray reflectivity from sputtered carbon thin films (1) Consideration of density gradient水沢まり, SAKURAI, Kenji. Photon Factory Activity Report 2003 PartB 21 60-60. 2004.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-11-20 10:35:29 +0900 更新時刻: 2020-11-20 10:35:29 +0900
