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Structural verification of Bi nanolines in Si using obvious-at-a-glance X-ray diffraction method

SAKATA Osami, MIKI, Kazushi, BOWLER, David.

Spring-8 Research Frontiers 50-51. 2006.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2020-11-20 10:35:22 +0900 Updated at: 2020-11-20 10:35:22 +0900

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