HOME > その他の文献 > 書誌詳細Structural verification of Bi nanolines in Si using obvious-at-a-glance X-ray diffraction methodSAKATA Osami, MIKI, Kazushi, BOWLER, David. Spring-8 Research Frontiers 50-51. 2006.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-11-20 10:35:22 +0900 更新時刻: 2020-11-20 10:35:22 +0900
