Selective X-ray analysis of electron localizing sites using capacitance or electrostatic force
(静電容量・静電気力による局在電子サイトの選択Ｘ線分析)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2020-11-20 10:41:50 +0900Updated at: 2024-04-01 19:27:51 +0900